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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/euromicro/WeissMS15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alexander_Schill>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Johannes_Wei%E2%88%9A%C3%BC>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peter_Mandl_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FSEAA.2015.16>
foaf:homepage <https://doi.org/10.1109/SEAA.2015.16>
dc:identifier DBLP conf/euromicro/WeissMS15 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FSEAA.2015.16 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
rdfs:label Executable Test Specifications Show No Negative Effect on Finding and Correcting Test Faults in Event Processing Application Development. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alexander_Schill>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Johannes_Wei%E2%88%9A%C3%BC>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peter_Mandl_0001>
swrc:pages 18-26 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/euromicro/2015>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/euromicro/WeissMS15/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/euromicro/WeissMS15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/euromicro/euromicro2015.html#WeissMS15>
rdfs:seeAlso <https://doi.org/10.1109/SEAA.2015.16>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/euromicro>
dc:title Executable Test Specifications Show No Negative Effect on Finding and Correcting Test Faults in Event Processing Application Development. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document