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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ewdts/SekyereSC23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Degang_Chen_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marampally_Saikiran>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Sekyere>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FEWDTS59469.2023.10297071>
foaf:homepage <https://doi.org/10.1109/EWDTS59469.2023.10297071>
dc:identifier DBLP conf/ewdts/SekyereSC23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FEWDTS59469.2023.10297071 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label A Power Supply Rejection Based Approach for Robust Defect Detection in Operational Amplifiers. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Degang_Chen_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marampally_Saikiran>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Sekyere>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ewdts/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ewdts/SekyereSC23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ewdts/SekyereSC23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ewdts/ewdts2023.html#SekyereSC23>
rdfs:seeAlso <https://doi.org/10.1109/EWDTS59469.2023.10297071>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ewdts>
dc:title A Power Supply Rejection Based Approach for Robust Defect Detection in Operational Amplifiers. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document