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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/fccm/WirthlinJRCG03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Darrel_Eric_Johnson>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_J._Wirthlin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_P._Caffrey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nathan_Rollins>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Paul_S._Graham>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FFPGA.2003.1227249>
foaf:homepage <https://doi.org/10.1109/FPGA.2003.1227249>
dc:identifier DBLP conf/fccm/WirthlinJRCG03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FFPGA.2003.1227249 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label The Reliability of FPGA Circuit Designs in the Presence of Radiation Induced Configuration Upsets. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Darrel_Eric_Johnson>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_J._Wirthlin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_P._Caffrey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nathan_Rollins>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Paul_S._Graham>
swrc:pages 133-142 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/fccm/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/fccm/WirthlinJRCG03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/fccm/WirthlinJRCG03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/fccm/fccm2003.html#WirthlinJRCG03>
rdfs:seeAlso <https://doi.org/10.1109/FPGA.2003.1227249>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/fccm>
dc:title The Reliability of FPGA Circuit Designs in the Presence of Radiation Induced Configuration Upsets. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document