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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/fdtc/VasselleTMME17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ad%E2%88%9A%C2%AEle_Morisset>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Aur%E2%88%9A%C2%A9lien_Vasselle>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hugues_Thiebeauld>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Quentin_Maouhoub>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S%E2%88%9A%C2%A9bastien_Ermeneux>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FFDTC.2017.18>
foaf:homepage <https://doi.org/10.1109/FDTC.2017.18>
dc:identifier DBLP conf/fdtc/VasselleTMME17 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FFDTC.2017.18 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
rdfs:label Laser-Induced Fault Injection on Smartphone Bypassing the Secure Boot. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ad%E2%88%9A%C2%AEle_Morisset>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Aur%E2%88%9A%C2%A9lien_Vasselle>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hugues_Thiebeauld>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Quentin_Maouhoub>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S%E2%88%9A%C2%A9bastien_Ermeneux>
swrc:pages 41-48 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/fdtc/2017>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/fdtc/fdtc2017.html#VasselleTMME17>
rdfs:seeAlso <https://doi.org/10.1109/FDTC.2017.18>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/fdtc>
dc:title Laser-Induced Fault Injection on Smartphone Bypassing the Secure Boot. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document