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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/fgit/ChaeJLC09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hochang_Chae>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jeonghun_Cho>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Seonghun_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiulin_Jin>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-642-10619-4%5F25>
foaf:homepage <https://doi.org/10.1007/978-3-642-10619-4_25>
dc:identifier DBLP conf/fgit/ChaeJLC09 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-642-10619-4%5F25 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hochang_Chae>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jeonghun_Cho>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Seonghun_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiulin_Jin>
swrc:pages 204-212 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/fgit/2009asea>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/fgit/ChaeJLC09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/fgit/ChaeJLC09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/fgit/asea2009.html#ChaeJLC09>
rdfs:seeAlso <https://doi.org/10.1007/978-3-642-10619-4_25>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/fgit>
dc:title TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document