On the Design of Reliable Boolean Circuits that Contain Partially Unreliable Gates
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/focs/KleitmanLM94
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1994
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On the Design of Reliable Boolean Circuits that Contain Partially Unreliable Gates
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332-346
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tight bound, reliable Boolean circuits design, partially unreliable gates, gate failure, short-circuit model, von Neumann model, worst-case faults, random faults, post-test alterations, fault-tolerant circuits
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On the Design of Reliable Boolean Circuits that Contain Partially Unreliable Gates
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