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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/fpl/AhmedZMTB18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ibrahim_Ahmed_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/James_Meijers>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Olivier_Trescases>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shuze_Zhao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vaughn_Betz>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FFPL.2018.00020>
foaf:homepage <https://doi.org/10.1109/FPL.2018.00020>
dc:identifier DBLP conf/fpl/AhmedZMTB18 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FFPL.2018.00020 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label Automatic BRAM Testing for Robust Dynamic Voltage Scaling for FPGAs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ibrahim_Ahmed_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/James_Meijers>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Olivier_Trescases>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shuze_Zhao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vaughn_Betz>
swrc:pages 68-75 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/fpl/2018>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/fpl/AhmedZMTB18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/fpl/AhmedZMTB18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/fpl/fpl2018.html#AhmedZMTB18>
rdfs:seeAlso <https://doi.org/10.1109/FPL.2018.00020>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/fpl>
dc:title Automatic BRAM Testing for Robust Dynamic Voltage Scaling for FPGAs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document