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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/fsdm/LuLZ17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haipeng_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mi_Lin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wei-feng_L%E2%88%9A%C4%BE>
foaf:homepage <http://dx.doi.org/doi.org%2F10.3233%2F978-1-61499-828-0-398>
foaf:homepage <https://doi.org/10.3233/978-1-61499-828-0-398>
dc:identifier DBLP conf/fsdm/LuLZ17 (xsd:string)
dc:identifier DOI doi.org%2F10.3233%2F978-1-61499-828-0-398 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
rdfs:label Investigation on Gate Capacitances Fluctuation Due to Work-Function Variation in Metal-Gate FinFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haipeng_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mi_Lin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wei-feng_L%E2%88%9A%C4%BE>
swrc:pages 398-403 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/fsdm/2017>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/fsdm/LuLZ17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/fsdm/LuLZ17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/fsdm/fsdm2017.html#LuLZ17>
rdfs:seeAlso <https://doi.org/10.3233/978-1-61499-828-0-398>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/fsdm>
dc:title Investigation on Gate Capacitances Fluctuation Due to Work-Function Variation in Metal-Gate FinFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document