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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ftcs/ChoiI93>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gwan_S._Choi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ravishankar_K._Iyer>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FFTCS.1993.627335>
foaf:homepage <https://doi.org/10.1109/FTCS.1993.627335>
dc:identifier DBLP conf/ftcs/ChoiI93 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FFTCS.1993.627335 (xsd:string)
dcterms:issued 1993 (xsd:gYear)
rdfs:label Wear-Out Simulation Environment for VLSI Designs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gwan_S._Choi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ravishankar_K._Iyer>
swrc:pages 320-329 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ftcs/1993>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ftcs/ChoiI93/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ftcs/ChoiI93>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ftcs/ftcs93.html#ChoiI93>
rdfs:seeAlso <https://doi.org/10.1109/FTCS.1993.627335>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ftcs>
dc:title Wear-Out Simulation Environment for VLSI Designs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document