[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ftcs/HamzaogluP99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ilker_Hamzaoglu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Janak_H._Patel>
foaf:homepage <http://csdl.computer.org/comp/proceedings/ftcs/1999/0213/00/02130260abs.htm>
foaf:homepage <http://dx.doi.org/10.1109%2FFTCS.1999.781060>
dc:identifier DBLP conf/ftcs/HamzaogluP99 (xsd:string)
dc:identifier DOI 10.1109%2FFTCS.1999.781060 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
rdfs:label Reducing Test Application Time for Full Scan Embedded Cores. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ilker_Hamzaoglu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Janak_H._Patel>
swrc:pages 260-267 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ftcs/1999>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ftcs/HamzaogluP99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ftcs/HamzaogluP99>
rdfs:seeAlso <http://csdl.computer.org/comp/proceedings/ftcs/1999/0213/00/02130260abs.htm>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ftcs/ftcs99.html#HamzaogluP99>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ftcs>
dc:subject embedded cores, design-for-testability, full scan, test generation, fault simulation (xsd:string)
dc:title Reducing Test Application Time for Full Scan Embedded Cores. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document