[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ftcs/KanekawaNSS96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Satoh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Makoto_Nohmi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nobuyasu_Kanekawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoshimichi_Satoh>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FFTCS.1996.534628>
foaf:homepage <https://doi.org/10.1109/FTCS.1996.534628>
dc:identifier DBLP conf/ftcs/KanekawaNSS96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FFTCS.1996.534628 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Self-Checking and Fail-Safe LSIs by Intra-Chip Redundancy. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Satoh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Makoto_Nohmi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nobuyasu_Kanekawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoshimichi_Satoh>
swrc:pages 426-430 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ftcs/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ftcs/KanekawaNSS96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ftcs/KanekawaNSS96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ftcs/ftcs96.html#KanekawaNSS96>
rdfs:seeAlso <https://doi.org/10.1109/FTCS.1996.534628>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ftcs>
dc:title Self-Checking and Fail-Safe LSIs by Intra-Chip Redundancy. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document