Monotonic static CMOS tradeoffs in sub-100nm technologies. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/glvlsi/BastaniZ06>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Ali_Bastani>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Charles_A._Zukowski>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1145%2F1127908.1127973>
foaf:homepage	<https://doi.org/10.1145/1127908.1127973>
dc:identifier	DBLP conf/glvlsi/BastaniZ06 (xsd:string)
dc:identifier	DOI doi.org%2F10.1145%2F1127908.1127973 (xsd:string)
dcterms:issued	2006 (xsd:gYear)
rdfs:label	Monotonic static CMOS tradeoffs in sub-100nm technologies. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Ali_Bastani>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Charles_A._Zukowski>
swrc:pages	278-283 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/glvlsi/2006>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/glvlsi/BastaniZ06/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/glvlsi/BastaniZ06>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/glvlsi/glvlsi2006.html#BastaniZ06>
rdfs:seeAlso	<https://doi.org/10.1145/1127908.1127973>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/glvlsi>
dc:subject	gate leakage current, low power design, monotonic static CMOS logic, noise tolerance, static power (xsd:string)
dc:title	Monotonic static CMOS tradeoffs in sub-100nm technologies. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
rdf:type	foaf:Document