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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/glvlsi/ButzenRFMRR08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_In%E2%88%9A%C2%B0cio_Reis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dionatan_S._Moura>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Erasmo_J._D._Chiappetta_Filho>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Leomar_S._da_Rosa_Jr.>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Paulo_F._Butzen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Renato_P._Ribas>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1366110.1366207>
foaf:homepage <https://doi.org/10.1145/1366110.1366207>
dc:identifier DBLP conf/glvlsi/ButzenRFMRR08 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1366110.1366207 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label Simple and accurate method for fast static currentestimation in cmos complex gates with interaction ofleakage mechanisms. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_In%E2%88%9A%C2%B0cio_Reis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dionatan_S._Moura>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Erasmo_J._D._Chiappetta_Filho>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Leomar_S._da_Rosa_Jr.>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Paulo_F._Butzen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Renato_P._Ribas>
swrc:pages 407-410 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/glvlsi/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/glvlsi/ButzenRFMRR08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/glvlsi/ButzenRFMRR08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/glvlsi/glvlsi2008.html#ButzenRFMRR08>
rdfs:seeAlso <https://doi.org/10.1145/1366110.1366207>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/glvlsi>
dc:subject cmos gates, leakage estimation, logic design (xsd:string)
dc:title Simple and accurate method for fast static currentestimation in cmos complex gates with interaction ofleakage mechanisms. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document