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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/glvlsi/DattaB10a>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Basab_Datta>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wayne_P._Burleson>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1785481.1785586>
foaf:homepage <https://doi.org/10.1145/1785481.1785586>
dc:identifier DBLP conf/glvlsi/DattaB10a (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1785481.1785586 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label Circuit-level NBTI macro-models for collaborative reliability monitoring. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Basab_Datta>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wayne_P._Burleson>
swrc:pages 453-458 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/glvlsi/2010>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/glvlsi/DattaB10a/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/glvlsi/DattaB10a>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/glvlsi/glvlsi2010.html#DattaB10a>
rdfs:seeAlso <https://doi.org/10.1145/1785481.1785586>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/glvlsi>
dc:subject NBTI, calibration, macro-models, on-chip sensors (xsd:string)
dc:title Circuit-level NBTI macro-models for collaborative reliability monitoring. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document