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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/glvlsi/EinspahrSA96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kent_L._Einspahr>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sharad_C._Seth>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
foaf:homepage <http://doi.ieeecomputersociety.org/10.1109/GLSV.1996.497635>
foaf:homepage <http://dx.doi.org/10.1109%2FGLSV.1996.497635>
dc:identifier DBLP conf/glvlsi/EinspahrSA96 (xsd:string)
dc:identifier DOI 10.1109%2FGLSV.1996.497635 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Improving Circuit Testability by Clock Control. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kent_L._Einspahr>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sharad_C._Seth>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
swrc:pages 288-293 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/glvlsi/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/glvlsi/EinspahrSA96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/glvlsi/EinspahrSA96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/glvlsi/glvlsi1996.html#EinspahrSA96>
rdfs:seeAlso <http://doi.ieeecomputersociety.org/10.1109/GLSV.1996.497635>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/glvlsi>
dc:title Improving Circuit Testability by Clock Control. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document