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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/glvlsi/GhoshR03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Indradeep_Ghosh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Srivaths_Ravi_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F764808.764884>
foaf:homepage <https://doi.org/10.1145/764808.764884>
dc:identifier DBLP conf/glvlsi/GhoshR03 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F764808.764884 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label On automatic generation of RTL validation test benches using circuit testing techniques. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Indradeep_Ghosh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Srivaths_Ravi_0001>
swrc:pages 289-294 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/glvlsi/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/glvlsi/GhoshR03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/glvlsi/GhoshR03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/glvlsi/glvlsi2003.html#GhoshR03>
rdfs:seeAlso <https://doi.org/10.1145/764808.764884>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/glvlsi>
dc:subject ATPG, OCCOM, RTL ATPG, RTL testing, branch coverage, code coverage, coverage metrics, design validation, fault coverage, generation, path coverage, small validation, test, test sets, testbench, testing, toggle coverage, universal test sets (xsd:string)
dc:title On automatic generation of RTL validation test benches using circuit testing techniques. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document