How to reduce aliasing in linear analog testing. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/glvlsi/Guo04>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Zhen_Guo>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1145%2F988952.989041>
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dc:identifier	DBLP conf/glvlsi/Guo04 (xsd:string)
dc:identifier	DOI doi.org%2F10.1145%2F988952.989041 (xsd:string)
dcterms:issued	2004 (xsd:gYear)
rdfs:label	How to reduce aliasing in linear analog testing. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Zhen_Guo>
swrc:pages	368-371 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/glvlsi/2004>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/glvlsi/Guo04/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/glvlsi/Guo04>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/glvlsi/glvlsi2004.html#Guo04>
rdfs:seeAlso	<https://doi.org/10.1145/988952.989041>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/glvlsi>
dc:subject	aliasing, analog testing, fault detection, parametric faults (xsd:string)
dc:title	How to reduce aliasing in linear analog testing. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
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