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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/glvlsi/HaghiD09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jeff_Draper>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mahta_Haghi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1531542.1531599>
foaf:homepage <https://doi.org/10.1145/1531542.1531599>
dc:identifier DBLP conf/glvlsi/HaghiD09 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1531542.1531599 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label The effect of design parameters on single-event upset sensitivity of MOS current mode logic. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jeff_Draper>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mahta_Haghi>
swrc:pages 233-238 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/glvlsi/2009>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/glvlsi/HaghiD09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/glvlsi/HaghiD09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/glvlsi/glvlsi2009.html#HaghiD09>
rdfs:seeAlso <https://doi.org/10.1145/1531542.1531599>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/glvlsi>
dc:subject design parameters, mos current mode logic (mcml), radiation hardening, single event upset (seu) (xsd:string)
dc:title The effect of design parameters on single-event upset sensitivity of MOS current mode logic. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document