Enhancing error resilience for reliable compression of VLSI test data.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/glvlsi/HashempourSL05
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2005
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Enhancing error resilience for reliable compression of VLSI test data.
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ATE, reliable compression, test data compression
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Enhancing error resilience for reliable compression of VLSI test data.
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