Numerical queue solution of thermal noise-induced soft errors in subthreshold CMOS devices.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/glvlsi/JannatySBMPZ10
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Numerical queue solution of thermal noise-induced soft errors in subthreshold CMOS devices.
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CMOS logic devices, Markov process, laplace transform, monte carlo method, poisson distribution, reliability
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Numerical queue solution of thermal noise-induced soft errors in subthreshold CMOS devices.
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