Pattern grading for testing critical paths considering power supply noise and crosstalk using a layout-aware quality metric.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/glvlsi/MaLTAG10
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Pattern grading for testing critical paths considering power supply noise and crosstalk using a layout-aware quality metric.
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crosstalk, path delay test, pattern grading, power supply noise, signal integrity
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Pattern grading for testing critical paths considering power supply noise and crosstalk using a layout-aware quality metric.
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