[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/glvlsi/MullaneMOF09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Brendan_Mullane>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ciaran_MacNamee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_Fleischmann>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vincent_O%27Brien>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1531542.1531564>
foaf:homepage <https://doi.org/10.1145/1531542.1531564>
dc:identifier DBLP conf/glvlsi/MullaneMOF09 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1531542.1531564 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label An on-chip solution for static ADC test and measurement. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Brendan_Mullane>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ciaran_MacNamee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thomas_Fleischmann>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vincent_O%27Brien>
swrc:pages 81-86 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/glvlsi/2009>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/glvlsi/MullaneMOF09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/glvlsi/MullaneMOF09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/glvlsi/glvlsi2009.html#MullaneMOF09>
rdfs:seeAlso <https://doi.org/10.1145/1531542.1531564>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/glvlsi>
dc:subject ADC-BiST, analog to digital converter, code histogram, linearity measurements, system-on-chip, test (xsd:string)
dc:title An on-chip solution for static ADC test and measurement. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document