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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/glvlsi/OliverCM06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hisham_Z._Massoud>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Krishnendu_Chakrabarty>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lara_D._Oliver>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1127908.1127935>
foaf:homepage <https://doi.org/10.1145/1127908.1127935>
dc:identifier DBLP conf/glvlsi/OliverCM06 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1127908.1127935 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label An evaluation of the impact of gate oxide tunneling on dual-Vt-based leakage reduction techniques. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hisham_Z._Massoud>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Krishnendu_Chakrabarty>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lara_D._Oliver>
swrc:pages 105-110 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/glvlsi/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/glvlsi/OliverCM06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/glvlsi/OliverCM06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/glvlsi/glvlsi2006.html#OliverCM06>
rdfs:seeAlso <https://doi.org/10.1145/1127908.1127935>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/glvlsi>
dc:subject dual threshold voltage, gate oxide tunneling, low power circuit design, subthreshold leakage (xsd:string)
dc:title An evaluation of the impact of gate oxide tunneling on dual-Vt-based leakage reduction techniques. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document