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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/glvlsi/PottingerL95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chien-Yuh_Lin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hardy_J._Pottinger>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FGLSV.1995.516060>
foaf:homepage <https://doi.org/10.1109/GLSV.1995.516060>
dc:identifier DBLP conf/glvlsi/PottingerL95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FGLSV.1995.516060 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Using a reconfigurable field programmable gate array to demonstrate boundary scan with built in self test. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chien-Yuh_Lin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hardy_J._Pottinger>
swrc:pages 242-245 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/glvlsi/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/glvlsi/PottingerL95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/glvlsi/PottingerL95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/glvlsi/glvlsi1995.html#PottingerL95>
rdfs:seeAlso <https://doi.org/10.1109/GLSV.1995.516060>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/glvlsi>
dc:subject field programmable gate arrays; built-in self test; logic testing; boundary scan testing; integrated circuit testing; design for testability; logic design; integrated circuit design; student experiments; educational aids; electronic engineering education; computer science education; built-in self-test; reconfigurable FPGA; field programmable gate array; boundary scan; XC4000 Logic Cell Array Family; Xilinx; IEEE Standard 1149.1; fault simulation; XC4003PC84-6; teaching; demonstration; BIST (xsd:string)
dc:title Using a reconfigurable field programmable gate array to demonstrate boundary scan with built in self test. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document