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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/glvlsi/RaahemifarA98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kaamran_Raahemifar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Majid_Ahmadi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FGLSV.1998.665244>
foaf:homepage <https://doi.org/10.1109/GLSV.1998.665244>
dc:identifier DBLP conf/glvlsi/RaahemifarA98 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FGLSV.1998.665244 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
rdfs:label A Design-for-Testability Technique for Detecting Delay Faults in Logic Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kaamran_Raahemifar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Majid_Ahmadi>
swrc:pages 249- (xsd:string)
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/glvlsi/glvlsi1998.html#RaahemifarA98>
rdfs:seeAlso <https://doi.org/10.1109/GLSV.1998.665244>
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dc:title A Design-for-Testability Technique for Detecting Delay Faults in Logic Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document