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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/glvlsi/ShiM04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Feng_Shi_0010>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yiorgos_Makris>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F988952.988984>
foaf:homepage <https://doi.org/10.1145/988952.988984>
dc:identifier DBLP conf/glvlsi/ShiM04 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F988952.988984 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label Fault simulation and random test generation for speed-independent circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Feng_Shi_0010>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yiorgos_Makris>
swrc:pages 127-130 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/glvlsi/2004>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/glvlsi/ShiM04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/glvlsi/ShiM04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/glvlsi/glvlsi2004.html#ShiM04>
rdfs:seeAlso <https://doi.org/10.1145/988952.988984>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/glvlsi>
dc:subject asynchronous circuits, fault simulation, random test pattern generation, speed-independent circuits (xsd:string)
dc:title Fault simulation and random test generation for speed-independent circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document