Polynomial coefficient based DC testing of non-linear analog circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/glvlsi/SindiaSA09
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/glvlsi/SindiaSA09
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Suraj_Sindia
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Virendra_Singh
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1145%2F1531542.1531562
>
foaf:
homepage
<
https://doi.org/10.1145/1531542.1531562
>
dc:
identifier
DBLP conf/glvlsi/SindiaSA09
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1145%2F1531542.1531562
(xsd:string)
dcterms:
issued
2009
(xsd:gYear)
rdfs:
label
Polynomial coefficient based DC testing of non-linear analog circuits.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Suraj_Sindia
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Virendra_Singh
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal
>
swrc:
pages
69-74
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/glvlsi/2009
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/glvlsi/SindiaSA09/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/glvlsi/SindiaSA09
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/glvlsi/glvlsi2009.html#SindiaSA09
>
rdfs:
seeAlso
<
https://doi.org/10.1145/1531542.1531562
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/glvlsi
>
dc:
subject
DC test, curve fitting, non-linear circuit test, parametric faults, polynomial
(xsd:string)
dc:
title
Polynomial coefficient based DC testing of non-linear analog circuits.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document