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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/glvlsi/ZhangMB95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gregory_E._Bridges>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Robert_D._McLeod>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zaifu_Zhang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FGLSV.1995.516049>
foaf:homepage <https://doi.org/10.1109/GLSV.1995.516049>
dc:identifier DBLP conf/glvlsi/ZhangMB95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FGLSV.1995.516049 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Statistical estimation of delay fault detectabilities and fault grading. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gregory_E._Bridges>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Robert_D._McLeod>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zaifu_Zhang>
swrc:pages 184-187 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/glvlsi/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/glvlsi/ZhangMB95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/glvlsi/ZhangMB95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/glvlsi/glvlsi1995.html#ZhangMB95>
rdfs:seeAlso <https://doi.org/10.1109/GLSV.1995.516049>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/glvlsi>
dc:subject fault diagnosis; logic testing; statistical analysis; VLSI; statistical estimation; delay fault detectabilities; fault grading; STAFAN; transition observabilities; fanout stems; fanout free region; gate line transition controllabilities; fault coverage; benchmark circuits; logic testing (xsd:string)
dc:title Statistical estimation of delay fault detectabilities and fault grading. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document