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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/his/AdamCSJIK11>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Asrul_Adam>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lim_Chun_Chew>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marzuki_Khalid>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mohd_Ibrahim_Shapiai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wen_Jau_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zuwairie_Ibrahim>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FHIS.2011.6122093>
foaf:homepage <https://doi.org/10.1109/HIS.2011.6122093>
dc:identifier DBLP conf/his/AdamCSJIK11 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FHIS.2011.6122093 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
rdfs:label A Hybrid Artificial Neural Network-Naive Bayes for solving imbalanced dataset problems in semiconductor manufacturing test process. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Asrul_Adam>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lim_Chun_Chew>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marzuki_Khalid>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mohd_Ibrahim_Shapiai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wen_Jau_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zuwairie_Ibrahim>
swrc:pages 133-138 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/his/2011>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/his/AdamCSJIK11/dblp>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/his/his2011.html#AdamCSJIK11>
rdfs:seeAlso <https://doi.org/10.1109/HIS.2011.6122093>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/his>
dc:title A Hybrid Artificial Neural Network-Naive Bayes for solving imbalanced dataset problems in semiconductor manufacturing test process. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document