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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/hldvt/MoharikarG17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jayakrishna_Guddeti>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pankaj_Moharikar>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FHLDVT.2017.8167462>
foaf:homepage <https://doi.org/10.1109/HLDVT.2017.8167462>
dc:identifier DBLP conf/hldvt/MoharikarG17 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FHLDVT.2017.8167462 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
rdfs:label Automated test generation for post silicon microcontroller validation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jayakrishna_Guddeti>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pankaj_Moharikar>
swrc:pages 45-52 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/hldvt/2017>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/hldvt/MoharikarG17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/hldvt/MoharikarG17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/hldvt/hldvt2017.html#MoharikarG17>
rdfs:seeAlso <https://doi.org/10.1109/HLDVT.2017.8167462>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/hldvt>
dc:title Automated test generation for post silicon microcontroller validation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document