[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/host/JeonLKC22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Byong-Deok_Choi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dong_Kyue_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dongmin_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Duhyun_Jeon>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FHOST54066.2022.9839746>
foaf:homepage <https://doi.org/10.1109/HOST54066.2022.9839746>
dc:identifier DBLP conf/host/JeonLKC22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FHOST54066.2022.9839746 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Contact PUF: Highly Stable Physical Unclonable Functions Based on Contact Failure Probability in 180 nm, 130 nm, and 28 nm CMOS Processes. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Byong-Deok_Choi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dong_Kyue_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dongmin_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Duhyun_Jeon>
swrc:pages 85-88 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/host/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/host/JeonLKC22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/host/JeonLKC22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/host/host2022.html#JeonLKC22>
rdfs:seeAlso <https://doi.org/10.1109/HOST54066.2022.9839746>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/host>
dc:title Contact PUF: Highly Stable Physical Unclonable Functions Based on Contact Failure Probability in 180 nm, 130 nm, and 28 nm CMOS Processes. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document