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foaf:homepage <https://doi.org/10.1109/HST.2014.6855583>
dc:identifier DBLP conf/host/ZussaDCR14 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FHST.2014.6855583 (xsd:string)
dcterms:issued 2014 (xsd:gYear)
rdfs:label Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter. (xsd:string)
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swrc:pages 130-135 (xsd:string)
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dc:title Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter. (xsd:string)
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rdf:type swrc:InProceedings
rdf:type foaf:Document