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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/huc/KhakifiroozF20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mahdi_Fathi_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marzieh_Khakifirooz>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F3410530.3414596>
foaf:homepage <https://doi.org/10.1145/3410530.3414596>
dc:identifier DBLP conf/huc/KhakifiroozF20 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F3410530.3414596 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label How particle detector can aid visual inspection for defect detection of TFT-LCD manufacturing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mahdi_Fathi_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marzieh_Khakifirooz>
swrc:pages 547-552 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/huc/2020ap>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/huc/KhakifiroozF20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/huc/KhakifiroozF20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/huc/ubicomp2020ap.html#KhakifiroozF20>
rdfs:seeAlso <https://doi.org/10.1145/3410530.3414596>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/huc>
dc:title How particle detector can aid visual inspection for defect detection of TFT-LCD manufacturing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document