[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/i2mtc/LinFSLH16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chi-Hung_Hwang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chun-Fu_Lin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hong-Ren_Fang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jyh-Rou_Sze>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sheng-Fuu_Lin>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FI2MTC.2016.7520497>
foaf:homepage <https://doi.org/10.1109/I2MTC.2016.7520497>
dc:identifier DBLP conf/i2mtc/LinFSLH16 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FI2MTC.2016.7520497 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
rdfs:label Real-time image data acquisition and inspection system for integrated circuit wafer after sawing process. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chi-Hung_Hwang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chun-Fu_Lin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hong-Ren_Fang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jyh-Rou_Sze>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sheng-Fuu_Lin>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/i2mtc/2016>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/i2mtc/LinFSLH16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/i2mtc/LinFSLH16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/i2mtc/i2mtc2016.html#LinFSLH16>
rdfs:seeAlso <https://doi.org/10.1109/I2MTC.2016.7520497>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/i2mtc>
dc:title Real-time image data acquisition and inspection system for integrated circuit wafer after sawing process. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document