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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icaisc/NaO04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hae-Seok_Oh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jae_Hyung_Na>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-540-24844-6%5F115>
foaf:homepage <https://doi.org/10.1007/978-3-540-24844-6_115>
dc:identifier DBLP conf/icaisc/NaO04 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-540-24844-6%5F115 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label Wafer Die Position Detection Using Hierarchical Gray Level Corner Detector. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hae-Seok_Oh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jae_Hyung_Na>
swrc:pages 748-753 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icaisc/2004>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icaisc/NaO04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icaisc/NaO04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icaisc/icaisc2004.html#NaO04>
rdfs:seeAlso <https://doi.org/10.1007/978-3-540-24844-6_115>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icaisc>
dc:title Wafer Die Position Detection Using Hierarchical Gray Level Corner Detector. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document