Diagonal Circuit Identity Testing and Lower Bounds. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/icalp/Saxena08>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Nitin_Saxena_0001>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1007%2F978-3-540-70575-8%5F6>
foaf:homepage	<https://doi.org/10.1007/978-3-540-70575-8_6>
dc:identifier	DBLP conf/icalp/Saxena08 (xsd:string)
dc:identifier	DOI doi.org%2F10.1007%2F978-3-540-70575-8%5F6 (xsd:string)
dcterms:issued	2008 (xsd:gYear)
rdfs:label	Diagonal Circuit Identity Testing and Lower Bounds. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Nitin_Saxena_0001>
swrc:pages	60-71 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/icalp/2008-1>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/icalp/Saxena08/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/icalp/Saxena08>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/icalp/icalp2008-1.html#Saxena08>
rdfs:seeAlso	<https://doi.org/10.1007/978-3-540-70575-8_6>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/icalp>
dc:subject	arithmetic circuit; identity testing; depth 3; depth 4; determinant; permanent; lower bounds (xsd:string)
dc:title	Diagonal Circuit Identity Testing and Lower Bounds. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
rdf:type	foaf:Document