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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icbase/GaoZS23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Deyi_Sun>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Minglei_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qiang_Gao>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICBASE59196.2023.10303229>
foaf:homepage <https://doi.org/10.1109/ICBASE59196.2023.10303229>
dc:identifier DBLP conf/icbase/GaoZS23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICBASE59196.2023.10303229 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Intelligent electronic information equipment maintenance and testing system based on general test instruments. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Deyi_Sun>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Minglei_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qiang_Gao>
swrc:pages 216-220 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icbase/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icbase/GaoZS23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icbase/GaoZS23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icbase/icbase2023.html#GaoZS23>
rdfs:seeAlso <https://doi.org/10.1109/ICBASE59196.2023.10303229>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icbase>
dc:title Intelligent electronic information equipment maintenance and testing system based on general test instruments. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document