[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccad/BiswasWMKC07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Frederic_T._Chong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gang_Wang_0015>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ryan_Kastner>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Susmit_Biswas>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tzvetan_S._Metodi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCAD.2007.4397359>
foaf:homepage <https://doi.org/10.1109/ICCAD.2007.4397359>
dc:identifier DBLP conf/iccad/BiswasWMKC07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCAD.2007.4397359 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label Combining static and dynamic defect-tolerance techniques for nanoscale memory systems. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Frederic_T._Chong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gang_Wang_0015>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ryan_Kastner>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Susmit_Biswas>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tzvetan_S._Metodi>
swrc:pages 773-778 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccad/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccad/BiswasWMKC07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccad/BiswasWMKC07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccad/iccad2007.html#BiswasWMKC07>
rdfs:seeAlso <https://doi.org/10.1109/ICCAD.2007.4397359>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccad>
dc:title Combining static and dynamic defect-tolerance techniques for nanoscale memory systems. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document