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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccad/ChangSF89>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ming-Feng_Chang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/W._Kent_Fuchs>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Weiping_Shi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCAD.1989.76944>
foaf:homepage <https://doi.org/10.1109/ICCAD.1989.76944>
dc:identifier DBLP conf/iccad/ChangSF89 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCAD.1989.76944 (xsd:string)
dcterms:issued 1989 (xsd:gYear)
rdfs:label Optimal wafer probe testing and diagnosis of k-out-of-n structures. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ming-Feng_Chang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/W._Kent_Fuchs>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Weiping_Shi>
swrc:pages 238-241 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccad/1989>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccad/ChangSF89/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccad/ChangSF89>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccad/iccad1989.html#ChangSF89>
rdfs:seeAlso <https://doi.org/10.1109/ICCAD.1989.76944>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccad>
dc:title Optimal wafer probe testing and diagnosis of k-out-of-n structures. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document