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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccad/CiplickasR96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dennis_J._Ciplickas>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ronald_A._Rohrer>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCAD.1996.569915>
foaf:homepage <https://doi.org/10.1109/ICCAD.1996.569915>
dc:identifier DBLP conf/iccad/CiplickasR96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCAD.1996.569915 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Expected current distributions for CMOS circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dennis_J._Ciplickas>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ronald_A._Rohrer>
swrc:pages 589-592 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccad/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccad/CiplickasR96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccad/CiplickasR96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccad/iccad1996.html#CiplickasR96>
rdfs:seeAlso <https://doi.org/10.1109/ICCAD.1996.569915>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccad>
dc:subject CMOS, switching current, autocorrelation, expected waveform, static analysis, statistical analysis, mean estimation, random processes, power spectral density (xsd:string)
dc:title Expected current distributions for CMOS circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document