Partial scan delay fault testing of asynchronous circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/iccad/KishinevskyKLST97
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Partial scan delay fault testing of asynchronous circuits.
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delay faults, sequential testing, asynchronous circuits, robust path delay fault testing
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Partial scan delay fault testing of asynchronous circuits.
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