[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccad/KondoC96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hisashi_Kondo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kwang-Ting_Cheng>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCAD.1996.569610>
foaf:homepage <https://doi.org/10.1109/ICCAD.1996.569610>
dc:identifier DBLP conf/iccad/KondoC96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCAD.1996.569610 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Driving toward higher IDDQ test quality for sequential circuits: a generalized fault model and its ATPG. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hisashi_Kondo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kwang-Ting_Cheng>
swrc:pages 228-232 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccad/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccad/KondoC96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccad/KondoC96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccad/iccad1996.html#KondoC96>
rdfs:seeAlso <https://doi.org/10.1109/ICCAD.1996.569610>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccad>
dc:subject IDDQ, Selective IDDQ, Fault model, Leakage Fault, Pseudo Stuck-at Fault, Sequential ATPG, Vector compaction, Test (xsd:string)
dc:title Driving toward higher IDDQ test quality for sequential circuits: a generalized fault model and its ATPG. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document