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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccad/LeeCKLY97>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chang-hoon_Choi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jei-Hwan_Yoo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jeong-Taek_Kong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sang-Hoon_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wong-Seong_Lee>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCAD.1997.643611>
foaf:homepage <https://doi.org/10.1109/ICCAD.1997.643611>
dc:identifier DBLP conf/iccad/LeeCKLY97 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCAD.1997.643611 (xsd:string)
dcterms:issued 1997 (xsd:gYear)
rdfs:label An efficient statistical analysis methodology and its application to high-density DRAMs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chang-hoon_Choi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jei-Hwan_Yoo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jeong-Taek_Kong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sang-Hoon_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wong-Seong_Lee>
swrc:pages 678-683 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccad/1997>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccad/LeeCKLY97/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccad/LeeCKLY97>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccad/iccad1997.html#LeeCKLY97>
rdfs:seeAlso <https://doi.org/10.1109/ICCAD.1997.643611>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccad>
dc:subject Design for Manufacturing , statistical SPICE modeling, Principal Component Analysis, Gradient Method, High-Density DRAMs (xsd:string)
dc:title An efficient statistical analysis methodology and its application to high-density DRAMs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document