Bayesian model fusion: a statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Chenjie_Gu>
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dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Xin_Li_0001>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FICCAD.2013.6691204>
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dc:title	Bayesian model fusion: a statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits. (xsd:string)
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