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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccad/SivaramanS96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andrzej_J._Strojwas>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mukund_Sivaraman>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCAD.1996.569900>
foaf:homepage <https://doi.org/10.1109/ICCAD.1996.569900>
dc:identifier DBLP conf/iccad/SivaramanS96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCAD.1996.569900 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Delay fault coverage: a realistic metric and an estimation technique for distributed path delay faults. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andrzej_J._Strojwas>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mukund_Sivaraman>
swrc:pages 494-501 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccad/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccad/SivaramanS96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccad/SivaramanS96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccad/iccad1996.html#SivaramanS96>
rdfs:seeAlso <https://doi.org/10.1109/ICCAD.1996.569900>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccad>
dc:subject delay testing, coverage, delay fault, path sensitization, fabrication process. (xsd:string)
dc:title Delay fault coverage: a realistic metric and an estimation technique for distributed path delay faults. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document