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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccad/SylvesterK98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dennis_Sylvester>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kurt_Keutzer>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F288548.288614>
foaf:homepage <https://doi.org/10.1145/288548.288614>
dc:identifier DBLP conf/iccad/SylvesterK98 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F288548.288614 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
rdfs:label Getting to the bottom of deep submicron. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dennis_Sylvester>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kurt_Keutzer>
swrc:pages 203-211 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccad/1998>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccad/SylvesterK98/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccad/SylvesterK98>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccad/iccad1998.html#SylvesterK98>
rdfs:seeAlso <https://doi.org/10.1145/288548.288614>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccad>
dc:subject ASIC, CMOS scaling, gate delay, interconnect modeling, power dissipation, signal integrity, wirelength (xsd:string)
dc:title Getting to the bottom of deep submicron. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document