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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccad/ZhuoBS09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cheng_Zhuo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/David_T._Blaauw>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dennis_Sylvester>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1687399.1687482>
foaf:homepage <https://doi.org/10.1145/1687399.1687482>
dc:identifier DBLP conf/iccad/ZhuoBS09 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1687399.1687482 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label Post-fabrication measurement-driven oxide breakdown reliability prediction and management. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cheng_Zhuo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/David_T._Blaauw>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dennis_Sylvester>
swrc:pages 441-448 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccad/2009>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccad/ZhuoBS09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccad/ZhuoBS09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccad/iccad2009.html#ZhuoBS09>
rdfs:seeAlso <https://doi.org/10.1145/1687399.1687482>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccad>
dc:title Post-fabrication measurement-driven oxide breakdown reliability prediction and management. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document