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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/icccnt/KumarS23c>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kosaraju_Sivani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pavan_Kumar>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCCNT56998.2023.10306835>
foaf:homepage <https://doi.org/10.1109/ICCCNT56998.2023.10306835>
dc:identifier DBLP conf/icccnt/KumarS23c (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCCNT56998.2023.10306835 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Double Gate TFET Simulation with Different Gate Oxides and Thickness. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kosaraju_Sivani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pavan_Kumar>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/icccnt/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/icccnt/KumarS23c/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/icccnt/KumarS23c>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/icccnt/icccnt2023.html#KumarS23c>
rdfs:seeAlso <https://doi.org/10.1109/ICCCNT56998.2023.10306835>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/icccnt>
dc:title Double Gate TFET Simulation with Different Gate Oxides and Thickness. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document