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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccct/JainKK15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gireesh_Kumar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Madhu_Jain>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Manju_Kaushik>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F2818567.2818656>
foaf:homepage <https://doi.org/10.1145/2818567.2818656>
dc:identifier DBLP conf/iccct/JainKK15 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F2818567.2818656 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
rdfs:label Reliability Analysis for Embedded System with Two Types of Faults and Common Cause Failure Using Markov process. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gireesh_Kumar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Madhu_Jain>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Manju_Kaushik>
swrc:pages 271-275 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccct/2015>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccct/JainKK15/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccct/JainKK15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccct/iccct2015.html#JainKK15>
rdfs:seeAlso <https://doi.org/10.1145/2818567.2818656>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccct>
dc:title Reliability Analysis for Embedded System with Two Types of Faults and Common Cause Failure Using Markov process. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document