Reliability Analysis for Embedded System with Two Types of Faults and Common Cause Failure Using Markov process.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/iccct/JainKK15
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Reliability Analysis for Embedded System with Two Types of Faults and Common Cause Failure Using Markov process.
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Reliability Analysis for Embedded System with Two Types of Faults and Common Cause Failure Using Markov process.
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