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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iccd/ArabiKS96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bozena_Kaminska>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Karim_Arabi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stephen_K._Sunter>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICCD.1996.563529>
foaf:homepage <https://doi.org/10.1109/ICCD.1996.563529>
dc:identifier DBLP conf/iccd/ArabiKS96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICCD.1996.563529 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Design for testability of integrated operational amplifiers using oscillation-test strategy. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bozena_Kaminska>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Karim_Arabi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stephen_K._Sunter>
swrc:pages 40-45 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iccd/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iccd/ArabiKS96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iccd/ArabiKS96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iccd/iccd1996.html#ArabiKS96>
rdfs:seeAlso <https://doi.org/10.1109/ICCD.1996.563529>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iccd>
dc:subject design for testability; design for testability; integrated operational amplifiers; oscillation-test strategy; operational amplifiers; vector-less test solution; test mode; oscillation frequency; Monte Carlo analysis; nominal tolerance; oscillators; digital circuitry; simulation; high fault coverage (xsd:string)
dc:title Design for testability of integrated operational amplifiers using oscillation-test strategy. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document